LabVIEW based Automation Guide for Microwave Measurements
Singapore: Springer Singapore, Imprint: Springer, 2018
Online
Monographie, Elektronische Ressource
- 1 Online-Ressource (XIV, 45 p. 31 illus. in color)
Zugriff:
Ermittle Ausleihstatus...
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LabVIEW based Automation Guide for Microwave Measurements
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Verantwortlichkeitsangabe: | by Satya Kesh Dubey, Naina Narang, P. S. Negi, V. N. Ojha |
Autor/in / Beteiligte Person: | Dubey, Satya Kesh ; Narang, Naina ; Negi, P. S. ; Ojha, V. N. |
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Veröffentlichung: | Singapore: Springer Singapore, Imprint: Springer, 2018 |
Medientyp: | Monographie |
Datenträgertyp: | Elektronische Ressource |
Umfang: | 1 Online-Ressource (XIV, 45 p. 31 illus. in color) |
ISBN: | 9789811062803 |
DOI: | 10.1007/978-981-10-6280-3 |
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