Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Cham: Springer International Publishing, Imprint: Springer, 2018
Online
Sammelwerk, Elektronische Ressource
- 1 Online-Ressource (XIII, 524 p. 134 illus)
Ermittle Ausleihstatus...
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
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Verantwortlichkeitsangabe: | edited by Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly |
Autor/in / Beteiligte Person: | Bai, Xiao ; Hancock, Edwin R. ; Ho, Tin Kam ; Wilson, Richard C. ; Biggio, Battista ; Robles-Kelly, Antonio |
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Veröffentlichung: | Cham: Springer International Publishing, Imprint: Springer, 2018 |
Medientyp: | Sammelwerk |
Datenträgertyp: | Elektronische Ressource |
Umfang: | 1 Online-Ressource (XIII, 524 p. 134 illus) |
ISBN: | 9783319977850 |
DOI: | 10.1007/978-3-319-97785-0 |
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