Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings
1st ed. 2021. - Cham: Springer International Publishing, Imprint: Springer, 2021
Online
Sammelwerk, Elektronische Ressource
- 1 Online-Ressource (XII, 378 p. 103 illus., 84 illus. in color)
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings
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Verantwortlichkeitsangabe: | edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly |
Autor/in / Beteiligte Person: | Torsello, Andrea ; Rossi, Luca ; Pelillo, Marcello ; Biggio, Battista ; Robles-Kelly, Antonio |
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Ausgabe: | 1st ed. 2021 |
Veröffentlichung: | Cham: Springer International Publishing, Imprint: Springer, 2021 |
Medientyp: | Sammelwerk |
Datenträgertyp: | Elektronische Ressource |
Umfang: | 1 Online-Ressource (XII, 378 p. 103 illus., 84 illus. in color) |
ISBN: | 9783030739737 |
DOI: | 10.1007/978-3-030-73973-7 |
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